The ROG Phone 5 might have failed its bend test due to its unique segmented board and dual battery design

[Redaktion]

Asus' new mobile-gaming flagship device, the ROG Phone 5, recently earned a shelving of shame following a catastrophic end to its round of JerryRigEverything's popular durability tests. This failure was thought to be due to a weak point caused by a secondary USB type C port found on one side; however, the ROG Phone 3 also had one, and proved much more robust. A teardown may reveal what else is going on with this new phone.

https://www.notebookcheck.net/The-ROG-Phone-5-might-have-failed-its-bend-test-due-to-its-unique-segmented-board-and-dual-battery-design.528647.0.html